Ex) Article Title, Author, Keywords
J. Korean Phy. Soc. 2011; 59(5): 3141-3145
Published online November 15, 2011 https://doi.org/10.3938/jkps.59.3141
Copyright © The Korean Physical Society.
Seolun Yang, H.-K. Park, J.-S. Kim
Kinetic stabilization of the interface between Fe and NiO films is achievedby growing Fe film on NiO film at low temperature (¡Â90 K) as revealed by X-ray photoelectron spectroscopy.This allows us to examine the effects of the interface coupling on exchange bias of Fe film by NiO film.No definite exchange bias of Fe film is, however, observed for (¡Â3 ML) ultrathin NiO films by x-ray magnetic circular dichroism study.This tells that exchange bias between Fe and NiO does not originate solely from the coupling between Fe and Ni ion at the interface.
Keywords: NiO, Ag, Ultrathin film
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