Journal of the Korean Physical Society

pISSN 0374-4884 eISSN 1976-8524
Qrcode

Article

J. Korean Phy. Soc. 2007; 51(1(2)): 88-91

Published online October 31, 2007     https://doi.org/10.3938/jkps.51.88

Copyright © The Korean Physical Society.

Electrode Dependence of Resistance Switching in NiO Thin Films

D. ?W. KIM, D. S. SHIN, S. H. CHANG, B. H. PARK, R. JUNG, X. S. LI, D. C. KIM, C.-W. LEE and S. SEO

Abstract

We report on the resistance switching behavior of NiO thin films grown on Pt bottom electrodes, with top electrodes of Pt, Au and Ni. NiO/Pt films with all the top electrodes show reversible switching from high-resistance state (HRS) to low-resistance state (LRS) and {it vice versa} during unipolar current-voltage ($I-V$) measurements. The resistance switching ratio of the Au/NiO/Pt structure is much smaller than those of others. The HRS $I-V$ curve of the Au/NiO/Pt structure is linear, while those of Pt/NiO/Pt and Ni/NiO/Pt structures are nonlinear. This result manifests the role of the top electrode material in the resistance switching behavior of the NiO thin films.

Keywords: Resistance switching, NiO, Current-voltage measurement