Ex) Article Title, Author, Keywords
J. Korean Phy. Soc. 2010; 57(6(1)): 1649-1652
Published online December 15, 2010 https://doi.org/10.3938/jkps.57.1649
Copyright © The Korean Physical Society.
Seung Hun Huh, Hae-Mi Ju, Sung-Ho Choi
The X-ray diffraction (XRD) patterns of thermally reduced graphenes from graphene oxide at 80?800 ¡ÆC were investigated. Importantly, the reduced graphene at 600 ¡ÆC, GP600, exhibits high-quality XRD patterns with a clean, sharp (002) peak with an interlayer distance of 3.392 ? similar to that of conventional graphene (~3.4 ?). The good reduction effect of the GP600 at a relatively low temperature is explained by the balance of thermal energy required for cracking oxide groups and the defect formation of two-dimensional carbon networks. The GP600 has average 8-layered structures with many wrinkles, a few-layered edge, including a monolayer and a double layer, and in-plane lattice ordering.
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