Second Harmonic Generation fromBi$_{3.75}$La$_{0.25}$Ti$_3$O$_{12}$ Thin Films Grown \by Sol-gelMethod
J. Korean Phy. Soc. 2009; 55: 1278~1281
Published online September 15, 2009 © 2009 The Korean Physical Society.

Abstract
Ferroelectric Bi$_{3.75}$La$_{0.25}$Ti$_3$O$_{12}$ (BLT) thin filmswere grown on Pt(111)/Ti/SiO$_2$/Si substrates by repeatedly usingthe sol-gel method at an 800 $^circ$C annealing temperature.Varying the film thickness via the number of applied sol-gelprocesses hardly changed the bulk structure as verified by X-raydiffraction and Raman spectroscopy. The optical second-harmonicsignal showed no appreciable change either while the phase of thegenerated second-harmonic signal increased gradually with the film'sthickness, suggesting that the second-harmonic signal originatedfrom the buried, bottom BLT layer.
Keywords: BLT thin film, Second-harmonic generation, SHG phase measurement, X-ray diffraction, Raman


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