Ex) Article Title, Author, Keywords
J. Korean Phy. Soc. 2009; 55(6): 2378-2382
Published online December 15, 2009 https://doi.org/10.3938/jkps.55.2378
Copyright © The Korean Physical Society.
S.H. Park, J.H. Ha, J.H. Lee, H.S. Kim, Y.H. Cho, Y.K. Kim
A thermal annealing process has been included in the Cadmium ZincTelludie (CZT) detector fabrication procedure to decrease theleakage current and to obtain a stable detector performance. Becauseof its low work function, indium can be used as the metal contact ofa CZT Schottky detector. The effect of low-temperature annealing onan indium/CZT contact was studied. CZT Schottky detectors with anindium/CZT/gold structure were made. The detectors were annealed for10 hours in a vacuum and for 2, 4, and 8 hours in air. The leakagecurrent and the energy resolution of each detector were measuredbefore and after the annealing process, and the measured data werecompared. The operating performance of CZT Schottky detector wasfound to be enhanced when the detector was annealed at a lowtemperature in air.
Keywords: CZT, Schottky detector, In/CZT contact, Leakage current
Copyright © 2016 The Korean Physical Society. All Rights Reserved.
The Korean Physical Society, 22, Teheran-ro 7-gil, Gangnam-gu, Seoul 06130, Korea
Tel:++82-2-556-4737 (EXT. #2)
Publication) Tel: +82-2-556-4737 (EXT. #3),
License No: 220-82-01588 President: Bumhoon Lee