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Temperature-dependent Dielectric Functions of InP between 25 K and 700 K
Y. D. Kim, T. J. Kim, J. J. Yoon, Y. H. Cha, S. Kim
J. Korean Phy. Soc. 2010; 57: 1960-1964  
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Study on Interface Analysis by Using Spectroscopic Ellipsometry
Y. D. Kim, T. J. Kim, T. H. Ghong, Y. W. Jung, J. J. Yoon
J. Korean Phy. Soc. 2009; 55: 2625-2629  
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Aging Study with High-Level Radiation Sources for the CMS Forward RPCs
H. C. Kim, R. J. Hu, S. H. Ahn, B. Hong, B. I. Kim, C. Kim, J. H. Kim, T. J. Kim, K. B. Lee, K. S. Lee, J. K. Lim, D. H. Moon, S. K. Park, M. S. Ryu, K. S. Sim, E. Won, S. Y. Bahk, S. J. Hong, Y. J. Kim, Y. U. Kim, D. G. Koo, S. J. Lee, S. K. Nam and J. T. Rhee
J. Korean Phy. Soc. 2008; 52: 913-919  
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Dielectric Function and Band-Gap Study of ZnSe Film
T. H. Ghong, T. J. Kim, J. J. Yoon, Y. D. Kim, H. J. Kim and Y. C. Chang
J. Korean Phy. Soc. 2008; 52: 84-87  
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Dielectric Functions of CdSe and ZnSe Obtained by Using Vacuum Ultra-Violet Spectroscopic Ellipsometry
T. J. Kim, S. Y. Lee, A. J. Choi, Y. D. Kim
J. Korean Phy. Soc. 2007; 50: 806-809  
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Study on the Dielectric Function of the CdMgTe Alloy by Using Vacuum Ultraviolet Spectroscopic Ellipsometry
T. J. Kim, Y. D. Kim and J. Kossut
J. Korean Phy. Soc. 2006; 49: 1156-  
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Study on Crystallization of a-Si Measured by Imaging Spectroscopic Ellipsometry
A. J. Choi, T. J. Kim, Y. D. Kim, J. H. Oh and J. Jang
J. Korean Phy. Soc. 2006; 48: 1544-  
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Ellipsometric Analysis on Interface Effects in CdMgTe and AlGaAs Multilayer Systems
T. J. KIM, T. H. GHONG, Y. S. IHN and Y. D. KIM
J. Korean Phy. Soc. 2005; 46: 171-  
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Dielectric Function Study on InGaAs Alloy Films
T. J. Kim, T. H. Ghong, Y. D. Kim
J. Korean Phy. Soc. 2004; 44: 726-  
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Study of the Dielectric Function of ZnS by Spectroscopic Ellipsometry
T. H. Ghong, T. J. Kim, Y. D. Kim, S. J. Kim, D. E. Aspnes, Y. D. Choi, Y-. M. Yu
J. Korean Phy. Soc. 2003; 42: 238-  
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