pISSN 0374-4884
eISSN 1976-8524

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Shim JI, Kim H, Shin DS, Yoo HY.  An Explanation of Efficiency Droop in InGaN-based Light Emitting Diodes: Saturated Radiative Recombination Rate at Randomly Distributed In-Rich Active Areas.  JKPS 2011;58:503-508.  https://doi.org/10.3938/jkps.58.503
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