X-ray Diffraction Patterns of Thermally-reduced Graphenes
J. Korean Phy. Soc. 2010; 57: 1649~1652
Published online December 15, 2010 © 2010 The Korean Physical Society.

Abstract
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The X-ray diffraction (XRD) patterns of thermally reduced graphenes from graphene oxide at 80?800 ¡ÆC were investigated. Importantly, the reduced graphene at 600 ¡ÆC, GP600, exhibits high-quality XRD patterns with a clean, sharp (002) peak with an interlayer distance of 3.392 ? similar to that of conventional graphene (~3.4 ?). The good reduction effect of the GP600 at a relatively low temperature is explained by the balance of thermal energy required for cracking oxide groups and the defect formation of two-dimensional carbon networks. The GP600 has average 8-layered structures with many wrinkles, a few-layered edge, including a monolayer and a double layer, and in-plane lattice ordering.



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