Journal of the Korean Physical Society

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Comparison between SiOC Thin Film by plasma enhance chemical vapor deposition and SiO₂ Thin Film by Fourier Transform Infrared Spectroscopy

teresa OH, Chi Kyu Choi

J. Korean Phy. Soc. 2010; 56: 1150-1155

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Comparison between Organic Thin Films Deposited by CCP-CVD and ICP-CVD

J. Korean Phy. Soc. 2009; 55: 1950-1954

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Study on the Dielectric Constant and on the Degree of Amorphous Structure Induced in Fluorinated Amorphous Carbon Films by Using X-ray Diffraction

Teresa Oh, Kwang-Man Lee, Chi Kyu Choi

J. Korean Phy. Soc. 2009; 55: 1553-1556

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Dependence of the Correlation between the Chemical Properties and the Current-Voltage Characteristics of Pentacene Channel OTFTs on the Surface Properties of SiOC Films

J. Korean Phy. Soc. 2007; 51: 528-533

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Properties of Organic Thin-Film Transistors on Hybrid-Type Interlayer Dielectric Materials

Teresa Oh, Hong Bae Kim

J. Korean Phy. Soc. 2006; 49: 865-

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Comparison of the Nano-Structure due to C=O and C=C Double Bond

Teresa Oh, Kwang-Man Lee, Kyung Sik Kim and Chi Kyu Choi

J. Korean Phy. Soc. 2004; 45: 705-

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Hydrogen Bonding of Low-k Materials Deposited by ICPCVD

Teresa Oh, Kwang-Man Lee, Heon-Ju Lee and Chi Kyu Choi

J. Korean Phy. Soc. 2004; 44: 1118-

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