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B-Site Disordered New Lead-Free Relaxor Ferroelectric Gd(Ni0.5Ti0.5)O3 System
D. J. Kim, S. Park, M. S. Jang, I.-K. Jeong, C. H. Park, S. S. Park, J. S. Bae, J. P. Kim, K. S. Hong, E. D. Jeong and Y. S. Kim
J. Korean Phy. Soc. 2008; 53: 3371-3374  
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A Study of the SrBiNbO Capacitor on Flexible Polymer Substrate
S. S. Park, M. K. Ryu, D. H. Cho, M. S. Jang, J. P. Kim and C. R. Cho
J. Korean Phy. Soc. 2005; 46: 277-  
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A Study of Ferroelectric Properties in NaKNbO Ceramic Compounds
D. H. Cho, M. K. Ryu, S. S. Park, S. Y. Cho, J. G. Choi, M. S. Jang, J. P. Kim and C. R. Cho
J. Korean Phy. Soc. 2005; 46: 151-  
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Characteristics of Ferroelectric in the Au/Sr$_{0.25}$Ba$_{0.75}$Nb$_2$O$_6$/Si Structure by C-V Measurement
M. K. Ryu, S. H. Lee, J. P. Kim, M. S. Jang, J. P. Kim
J. Korean Phy. Soc. 2003; 42: 1366-  
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Crystal Structures and Ferroelectric Properties of La-doped Bi$_4$Ti$_3$O$_{12}$ Crystals
J. P. Kim, C. R. Cho, S. H. Lee, M. K. Ryu, M. S. Jang
J. Korean Phy. Soc. 2003; 42: 1240-  
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The Effect of Si Dissolution on the Stability of Silica Particles and its Influence on Chemical Mechanical Polishing for Interlayer Dielectric
U. G. Paik, J. P. Kim, Y. S. Jung, Y. G. Jung, T. Katoh, J. G. Park, V. A. Hackley
J. Korean Phy. Soc. 2001; 39: 201-  
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Modification of Electrokinetic Behavior of CeO$_2$ Abrasive Particles in Chemical Mechanical Polishing for Shallow Trench Isolation
J. P. Kim, J. G. Yeo, U Paik, Y. G. Jung, J. G. Park, V. A. Hackley
J. Korean Phy. Soc. 2001; 39: 197-  
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Microstructure and Dielectric Properties of Lanthanum Bismuth Titanate Thin Films
J. P. Kim, Y. S. Yang, S. H. Lee, H. J. Joo, M. S. Jang
J. Korean Phy. Soc. 1999; 35: 1202-  
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Thickness Dependence of the Electrical Properties for PZT Films
S. H. Lee, H. J. Joo, J. P. Kim, J. H. Jung, M. K. Ryu, S. S. Lee, M. S. Jang
J. Korean Phy. Soc. 1999; 35: 1172-  
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Space Charge Effects in the Photocurrent Spectrum of Ferroelectric Pb(Zr, Ti)O$_3$ Thin Films
Y. S. Yang, J. P. Kim, S. H. Lee, H. J. Joo, M. S. Jang
J. Korean Phy. Soc. 1999; 35: 1168-  
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